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The Insight Paradox: is Better Insight Associated with Depression Among Patients with Schizophrenia?
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- Journal:
- European Psychiatry / Volume 30 / Issue S1 / March 2015
- Published online by Cambridge University Press:
- 15 April 2020, p. 1
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High performance SiC detectors for MeV ion beams generated by intense pulsed laser plasmas
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- Journal:
- Journal of Materials Research / Volume 28 / Issue 1 / 14 January 2013
- Published online by Cambridge University Press:
- 05 July 2012, pp. 87-93
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- 14 January 2013
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Structural and electrical characterization of n+-type ion-implanted 6H-SiC
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- Journal:
- The European Physical Journal - Applied Physics / Volume 27 / Issue 1-3 / July 2004
- Published online by Cambridge University Press:
- 15 July 2004, pp. 239-242
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- July 2004
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Structural and Electrical Characterisation of Nickel Silicides Contacts on Silicon Carbide
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- Journal:
- MRS Online Proceedings Library Archive / Volume 680 / 2001
- Published online by Cambridge University Press:
- 21 March 2011, E6.9
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- 2001
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Structural Properties of 3C-SiC Layers Grown on Si Substrates by Electron Cyclotron Resonance CVD Technique
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- MRS Online Proceedings Library Archive / Volume 640 / 2000
- Published online by Cambridge University Press:
- 21 March 2011, H5.9
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- 2000
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Carbon Rich a-Si1-xCx:H Films: An Investigation On Radiative Recombination Properties
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- Journal:
- MRS Online Proceedings Library Archive / Volume 507 / 1998
- Published online by Cambridge University Press:
- 10 February 2011, 261
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- 1998
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Defect annealing in ion implanted silicon carbide
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- Journal:
- Journal of Materials Research / Volume 12 / Issue 7 / July 1997
- Published online by Cambridge University Press:
- 31 January 2011, pp. 1727-1733
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- July 1997
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